Search results for: Yin Chen
Quality and Reliability Engineering International > 36 > 5 > 1622 - 1638
IEEE Electron Device Letters > 2014 > 35 > 2 > 199 - 201
European Journal of Operational Research > 2013 > 231 > 3 > 631-644
Mechanical Systems and Signal Processing > 2013 > 35 > 1-2 > 219-237