Search results for: Yuan Lu
IEEE Electron Device Letters > 2009 > 30 > 4 > 380 - 382
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419
IEEE Electron Device Letters > 2009 > 30 > 4 > 380 - 382
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 407 - 419