A method to analytically calculate the column length distribution (CLD) from a single reflection of a strain‐free nanocrystalline metal is proposed. It involves precise estimation of the peak background level using a physical criterion – the positivity of the CLD. The method can be applied to materials showing a dependence of the lattice constant on the crystal size, because of which the diffraction...
Financed by the National Centre for Research and Development under grant No. SP/I/1/77065/10 by the strategic scientific research and experimental development program:
SYNAT - “Interdisciplinary System for Interactive Scientific and Scientific-Technical Information”.