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X-ray absorption fine structure has been used to study the electronic structure, and bond length of ZnO thin films grown on sapphire and Si substrates by metalorganic chemical vapor deposition. X-ray absorption near edge structure (XANES) of O and Zn K-edge were shown, and a detailed analysis of extended x-ray absorption fine structure (EXAFS) of Zn K-edge indicates that difference substrates results...
In this paper, room temperature thermoelectric (TE) properties of wide bandgap thin film GaN and bulk ZnO are studied. Bulk GaN is also incorporated with epitaxy films to make comparison. GaN and ZnO materials have superior electrical performance and chemical stability at high temperatures and are currently found in many commercial applications, such as, photovoltaic, solid‐state lighting, and gas...
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