Search results for: A. Dasgupta
2015 IEEE International Electron Devices Meeting (IEDM) > 21.1.1 - 21.1.4
Electronics Letters > 2009 > 45 > 10 > 527 - 528
2007 Internatonal Conference on Microelectronics > 429 - 432
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 602 - 610