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The paper reviews previous work on the DC inclined plane test and suggests equivalent DC voltage levels in parallel to AC voltage in the ASTM inclined plane tracking and erosion test. The aim of this work is to provide a basis for standardizing the inclined plane test for DC voltage. Round robin tests done in five laboratories on five specimens of a silicone rubber material were done with the purpose...
In the field of nanoparticle material science, X-ray scattering techniques are widely used for characterization of macromolecules and particle systems (ordered, partially-ordered or custom) based on their structural properties at the micro- and nano-scales. Numerous applications utilize these, including design and fabrication of energy-relevant nanodevices such as photovoltaic and energy storage devices...
This paper discusses a thermal reliability testing experiment and failure analysis (FA) in 32nm SOI Si technology chip packages. Thermal performance of the TIM materials is monitored and physical failure analysis is performed on test vehicle packages post thermal reliability test. Thermomechanical modeling is conducted for different test conditions. TIM thermal degradation is observed at the chip...
This paper presents a special portable apparatus for workpiece magnetism determination of joule balance at NIM. It could be used to evaluate easily the magnetic variation of mechanical parts before and after processing, quickly measuring weak magnetic properties of materials. The measuring process is simple without a customized sample. From the variation of a mutual inductance value in two different...
The reliability of complex interconnect structures at all levels of the chip integration hierarchy has become a major concern due to the use of fine feature sizes, diverse materials, and complex 3D architectures. Reliability issues range from stress related failures such as dielectric cracking and interface debonding during manufacturing to electrical and mechanical failures such as electromigration...
A numerical simulation of the performance of CIGS solar cells has been carried out using the AMPS-1D device simulation program to study the sensitivity of cell performance (efficiency, photo-J-V, and QE characteristics) on material parameters. The simulation results suggest that the carrier mobility, recombination center density, and carrier density in the CdS and CIGS absorber layers most influence...
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