Search results for: S. Sen
IEEE Design & Test of Computers > 2010 > 27 > 6 > 6 - 17
2008 45th ACM/IEEE Design Automation Conference > 492 - 497
IEEE Design & Test of Computers > 2010 > 27 > 6 > 6 - 17
2008 45th ACM/IEEE Design Automation Conference > 492 - 497