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This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
Technology advances in mixed-mode and analog ICs, involving multiple functions inside the device, make Failure Analysis (FA) difficult. Variation Mapping techniques based on Thermal Laser Stimulation (TLS [1],[2],[3]) have already proven their efficiency for the localization of a physical defect or design weakness. Their extension will play a key FA role but the impact of IR laser beam on the basic...
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
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