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Electro-Optical Probing (EOP) has shown its efficiency in the world of failure analysis. The different external physical parameters effects, especially the temperature, on the EOP signals are not well known and not that much described in the literature. In addition to thermoreflectance, the temperature is a parameter that affects directly the free carrier's distribution and carrier mobilities inside...
Laser stimulation techniques are continuously developed in accordance with the apparition of new kind of defect. We propose the full dynamic laser stimulation where the test is fully embedded in the localization process. By using a modulated laser instead of a continuous one we discriminate vectors fail in addition to localization.
This article shows how the magnetic technique can be improved to obtain more precise information about fault localization, particularly when other techniques cannot be used. We propose a new methodology based on the coupling of magnetic measurements with magnetic simulations, which we validate on a real case device.
Dynamic laser stimulation techniques have been developed with success for failure analysis of integrated circuit subjected to ldquosoft defectrdquo. Weakness in design and physical defect can be isolated and located through these methodologies for digital, analog and mixed mode devices. But they are now successfully used embedded in qualification process since they provide accurate information about...
This paper presents principles and results of dynamic testing of an SRAM-based FPGA using time- resolved fault injection with a pulsed laser. The synchronization setup and experimental procedure are detailed. Fault injection results obtained with a DES crypto-core application implemented on a Xilinx Virtex II are discussed.
Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve accuracy of fault isolation and defect localization.
Thermal Laser Stimulation images are normally acquired using an averaging scheme to improve signal detection. However it does not work well when strong perturbation signals are present. For these cases correlation methods, which are more effective at extracting weak signals embedded in strong perturbations, become more important for TLS techniques.
This paper presents new approaches for timing analysis in fast integrated circuits using picosecond pulsed laser stimulation. The proposed techniques provide very good temporal resolution as illustrated by several case studies on digital test structures. They can be used for localizing defects inducing timing faults.
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