Search results for: B. Li
IEEE Electron Device Letters > 2014 > 35 > 5 > 572 - 574
2011 International Reliability Physics Symposium > 2F.2.1 - 2F.2.8
IEEE Electron Device Letters > 2011 > 32 > 6 > 806 - 808
2010 International Electron Devices Meeting > 33.5.1 - 33.5.4
IEEE Electron Device Letters > 2010 > 31 > 4 > 347 - 349