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National Physical Laboratory, New Delhi (NPLI) has been maintaining time scale UTC (NPLI) with only one cesium atomic clock. NPLI has recently developed an automatic intercomparison system for the development of better time scale combining all its five clocks. A new algorithm has also been developed for this purpose. Using this algorithm, the analysis has been done based on the preliminary measurement...
Measurement of dielectric constant and tangent loss is very crucial for the understanding of electromagnetic properties of materials at microwave frequencies. In this work we have reported an analytical formula and a very simple experimental arrangement at X-band frequencies for the measurement of dielectric properties of liquids.
In this paper an analytical formula for the measurement of the dielectric constant of materials having cylindrical shape is derived using cavity perturbation method. The formula is established using two known samples Teflon and Perspex at X-band frequencies and the results are compared with those obtained for rectangular samples.
The cavity perturbation method is widely used in the study of electromagnetic properties of dielectric materials at X-band frequencies. It works well for the measurement of low-loss and medium loss materials. In this paper an easy and reliable method is discussed for the accurate determination of the dielectric constant of medium loss samples such as Teflon and Perspex.
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