The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Modelling at gigahertz frequencies is often based on (non)linear microwave/millimeter wave measurements. These measurements are usually considered ideal in modelling procedures. In this work, we demonstrate how measurement uncertainty may impact model extraction in two application areas: biofluidic modelling and large-signal transistor modelling.
We extract the nonlinear model of a 0.15 μm GaAs pHEMT for cold-FET mixer applications. The model parameters are extracted from experimental data obtained by simultaneously driving the device under test with low-frequency large signals and a tickle tone at the RF operating frequency. The advantage of this approach is twofold. Firstly, as a result of a single measurement one can get separately the...
The manuscript presents a comparison between nonlinear and linear de-embedding procedures for the identification of the I/V dynamic characteristics at the transistor current-generator plane. These approaches, without the need for modeling device trapping and thermal effects, allow to retrieving the waveforms of the electrical quantities at the current generator that governs device performance in terms...
Measurements of low- and high-frequency vector-calibrated large-signal waveforms are exploited in this work to identify the parameters of a FET nonlinear model. The IDS nonlinear current source and the nonlinear charge sources' parameters are respectively determined from a small set of low- (2 MHz) and high-frequency (8 GHz) load-pull measurements by using a least square numerical optimization. Under...
In this work a de-embedding technique oriented to the determination of FET I-V dynamic characteristics is reported. It exploits high-frequency large-signal measurements and a model based description of the reactive nonlinearities. The proposed technique allows one to gather information about the intrinsic I-V dynamics, including traps related dispersion and thermal phenomena, directly from high-frequency...
In this work, measurements of the high frequency as well as the low frequency response of a non-linear microwave circuit are reported. The developed set-up is based on an extension of the LSNA and it enables the simultaneous measurement of baseband response and RF behaviour. Thanks to this capability a direct correlation between the variation of baseband impedance and asymmetry of distortion components...
This work presents a way to determine the complete response, encompassing both the low- and high-frequency components, at the device terminals within a microwave circuit. The measurement set-up is based on an extension of the large-signal network analyser. Experimental results on a GaAs power amplifier are analysed.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.