A novel RHBD technique utilizing charge sharing to mitigate single-event voltage transients in differential circuits is demonstrated experimentally. Differential charge cancellation (DCC) layout leverages the inherent common-mode rejection of differential circuits to mitigate voltage transients induced by ion strikes. A simple layout variation transforms normally single-ended error signals into common-mode...
Novel RHBD techniques are described that utilize charge sharing to mitigate voltage transients due to single event strikes in a folded cascode operational amplifier. These techniques are verified using simulations in a 180-nm CMOS process.
A layout technique that exploits single-event transient pulse quenching to mitigate transients in combinational logic is presented. TCAD simulations show as much as 60% reduction in sensitive area and 70% reduction in pulse width for some logic cells.
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