Search results for: Elbert Huang
2015 IEEE International Electron Devices Meeting (IEDM) > 8.1.1 - 8.1.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 3A.3.1 - 3A.3.9
Journal of Electronic Materials > 2004 > 33 > 2 > 135-140
2015 IEEE International Electron Devices Meeting (IEDM) > 8.1.1 - 8.1.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 3A.3.1 - 3A.3.9
Journal of Electronic Materials > 2004 > 33 > 2 > 135-140