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One of the major purposes of characterizing discrete device reliability is to provide reasonable margin during design phase. Prevention is always better than a cure from risk control and cost management point of view. Over the last decade, foundry has been asked to provide aging aware IP and cell library to reduce customers' product development cycle. Though these libraries were well characterized...
This paper proposes a design of IT memory cells that utilizes the modulation of drain current by channel traps and offers these advantages: 1. capacitorless structure, 2. long data retention time, 3. excellent endurance characteristics, 4. low power consumption, 5. 3D integration compatibility.
The metal/oxide/n-silicon tunneling diodes with hydrogen (deuterium) passivated Si/SiO 2 interface are stressed under hole-injection conditions to investigate the mechanism of gate oxide degradation. Although the isotope effect on soft breakdown was previously observed in the deuterium-annealed metal/oxide/p-silicon devices, no isotope effect on the oxide soft breakdown was observed in the...
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