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An improved wavelet transform method for the analysis of specular X-ray reflectivity data has been developed. It permits the evaluation of the thickness and roughness of particular layers in the thin film without assuming a certain film structure. The advantage of this method is that it can be applied to the analysis of a multilayer with unknown chemical and physical properties. It is useful in the...
Layer structures of monolayer and multilayers composed of passivated silver (Ag) nanoparticles are analyzed using X-ray reflectivity (XR) measurements. In the XR profile of the monolayer, the ''Kiessig fringe'' is observed above the critical angle. A simple layer model is suitable for the nanoparticle layer structure in the low-angle region. A distinct quasi-Bragg reflection (QBR) due to the periodical...
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