The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The cover image is based on the Research Article A method to study the electric field distribution on sample surfaces in atom probe analysis by Sunwei Chen et al., https://doi.org/10.1002/sia.6756.
We report the development of a nondestructive method to estimate the electric field (EF) distribution on a nano‐sized sample surface in atom probe (AP) analysis. The simulated EF distribution on an ideal hemisphere indicates that the largest EF exists on the geometrical top of the ideal hemisphere and that EF decreases as the emitting area getting away from the sample apex. To estimate the EF distribution...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.