Search results for: Yi Zhao
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
IEEE Electron Device Letters > 2017 > 38 > 4 > 434 - 437
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 909 - 915
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3669 - 3676
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1136 - 1142
IEEE Electron Device Letters > 2014 > 35 > 7 > 714 - 716
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 950 - 952
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 8 > 1680 - 1693
IEEE Electron Device Letters > 2011 > 32 > 8 > 1005 - 1007
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2057 - 2066
IEEE Electron Device Letters > 2009 > 30 > 9 > 987 - 989
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1152 - 1156
IEEE Transactions on Nanotechnology > 2008 > 7 > 1 > 40 - 47