Search results for: J.‐A. Kim
Statistics for Industry and Technology > Parametric and Semiparametric Models with Applications to Reliability, Survival Analysis, and Quality of Life > Analyses of Censored and Truncated Data > 177-210
Statistics for Industry and Technology > Parametric and Semiparametric Models with Applications to Reliability, Survival Analysis, and Quality of Life > Analyses of Censored and Truncated Data > 177-210