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An atomic Monte-Carlo simulator of Conductive Bridge Random Access Memory (CBRAM) is developed to investigate the microscopic properties of filament growth and dissolution during Forming/SET and RESET processes. The cluster growth during nucleation correlated with electrochemical reactions and cations transportation are included. The impacts of the critical material parameters on the geometry of conductive...
Excellent rectifying characteristics are demonstrated in the fab-friendly n-Si/HfO2/Ni/TiN devices with rectification ratio of >107 and the driving current of 1mA as a 1D-like selector. The rectified unipolar switching behaviors are demonstrated in the 1D1R cell structured with a diode-like device of n-Si/HfO2/Ni/TiN (1D) and a unipolar RRAM of n+-Si/HfOx/Ni/TiN (1R). Based on the measured I–V...
A new operation scheme on oxide-based resistive-switching devices [resistive random access memory (RRAM)] is proposed to improve the controllability of switching processes in order to achieve an improved memory performance. The improved device-to-device and cycle-to-cycle uniformity, reduced RESET current, and adjustable RHRS/RLRS ratio are demonstrated in the HfOx-based RRAM devices by using the...
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