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We report on the accuracy and repeatability tests for near-field scanning microwave microscopy applications by associating a network analyzer and an evanescent microwave probe (EMP). A broadband matching network based on an interferometric technique is used to achieve a strong electromagnetic coupling between the probe tip and the material in the frequency range 1–20 GHz. The electromagnetic coupling...
We describe in this paper a new technique for measurement of reflection coefficients of high impedances devices in radio frequency (RF). To that end, a system intrinsically high impedance (characteristic impedance = 1 kΩ) based on a multi-port technique is developed. The validation of the approach chosen is made by measuring high value resistors.
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