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An interferometric technique for scanning near-field microscopy applications is proposed. The method is based on the association of a vector network analyzer, an evanescent microwave coaxial probe and a precise interferometer built up with a power divider, a phase-shifter and an attenuator. Advantages such as simplicity of operation, broad frequency band capabilities and high measurement sensitivity...
We describe in this paper a new technique for measurement of reflection coefficients of high impedances devices in radio frequency (RF). To that end, a system intrinsically high impedance (characteristic impedance = 1 kΩ) based on a multi-port technique is developed. The validation of the approach chosen is made by measuring high value resistors.
A multi-port based near field microwave-wave microscope is proposed for local characterization of materials with a sub-wavelength resolution of 60 μm at 2.655 GHz (~λ/2000). It is demonstrated that the combination of a four-port reflectometer and a microstrip evanescent microwave probe represents a viable and promising alternative to the costly heterodyne principle. The depth and lateral resolutions...
A new wide-band (1–4 GHz) four-port reflectometer is proposed as an alternative to the well-known six-port reflectometer. The prototype circuit is fabricated to validate this new concept by means of a hybrid integrated-circuit technology. The topology that has been conceived is also suitable for monolithic-microwave integrated-circuit fabrication. Associated to this system, a new simple explicit calibration...
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