The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
An improved CMOS buffer for high-speed ADC testing is presented. It is based on the circuit means to stabilize the DC output voltage of source-follower test buffer through the replica circuit and amplifier in a feedback loop to generate a regulated biasing voltage. With this biasing arrangement, the proposed test buffer maintains high-speed characteristics whilst yet preserving the headroom for test...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.