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Faster than at-speed testing provides an efficient way for testing of small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of patterns is managed to be applied at certain frequency. In this paper, we propose to generate tests for faster than at-speed testing based on path delay fault (PDF) model and single...
Faster than at-speed testing provides an effective way to detect small delay defects (SDDs). It requires test patterns to be delicately classified into groups according to the delay of sensitized paths. Each group of patterns is applied at certain frequency. In this paper, we propose to generate tests for faster than at-speed testing using path delay fault (PDF) model and single path sensitization...
Conventional random access scan (RAS) designs, although economic in test power dissipation, test application time and test data volume, are expensive in area and routing overhead. In this paper, we present a localized RAS architecture (LRAS) to address this issue. A novel scan cell structure, which has fewer transistors than the multiplexer-type scan cell, is proposed to eliminate the global test...
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