The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The failure rate of static RAM (SRAM) cells is restricted to be extremely low to ensure sufficient high yield for the entire chip. In addition, multiple performances of interest and influences from peripherals make SRAM failure rate estimation a high-dimensional multiple-failure-region problem. This paper proposes a new method featuring a multistart-point sequential quadratic programming (SQP) framework...
Conventional yield optimization approaches rely on accurate yield estimation for given design parameters, which would be computational intensive. In this paper, a novel Bayesian yield optimization approach is proposed for analog and SRAM circuits. An equivalent problem is formulated via applying Bayes' theorem on the augmented yield problem. The yield optimization problem is converted to identifying...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.