Search results for: Michael Pecht
IEEE Design & Test of Computers > 2011 > 28 > 6 > 58 - 65
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 374 - 380
IEEE Design & Test of Computers > 2011 > 28 > 6 > 58 - 65
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 374 - 380