Search results for: Michael Pecht
Microelectronics Reliability > 2017 > 79 > C > 175-192
Microelectronics Reliability > 2017 > 75 > C > 77-95
Microelectronics Reliability > 2017 > 70 > C > 59-69
Microelectronics Reliability > 2017 > 69 > C > 29-35
Microelectronics Reliability > 2016 > 65 > C > 1-7
Microelectronics Reliability > 2016 > 63 > C > 320-324
Microelectronics Reliability > 2016 > 62 > C > 113-123
Microelectronics Reliability > 2016 > 56 > C > 182-188
Microelectronics Reliability > 2015 > 55 > 7 > 1054-1059
Microelectronics Reliability > 2015 > 55 > 3-4 > 527-537
Microelectronics Reliability > 2015 > 55 > 3-4 > 582-587
Microelectronics Reliability > 2015 > 55 > 1 > 123-128
Microelectronics Reliability > 2014 > 54 > 1 > 214-219
Microelectronics Reliability > 2013 > 53 > 12 > 2052-2056
Microelectronics Reliability > 2013 > 53 > 8 > 1117-1129
Microelectronics Reliability > 2013 > 53 > 6 > 811-820
Microelectronics Reliability > 2013 > 53 > 6 > 805-810
Microelectronics Reliability > 2013 > 53 > 6 > 832-839
Microelectronics Reliability > 2013 > 53 > 6 > 840-847
Microelectronics Reliability > 2012 > 52 > 6 > 953-957