The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Thermoreflectance thermal imaging microscopy is based on very small change in the surface reflection as a function of temperature. Image shift and instrument drift are limiting factors to obtain accurate and reproducible thermal images. Under large magnification and for devices with sizes on the order of hundreds of nanometers, image registration could significantly encumber accurate thermoreflectance...
Akin to any experimental system, thermoreflectance thermal imaging is not immune to different sources of noise. Although averaging the thermal images over long times can minimize the impact of the noise on the measurement, electrical, thermal and optical noises can still exist that can, subsequently, affect the accuracy of the temperature measurement. The goal of this work is to systematically look...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.