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In this work, we investigate different printing technologies suitable for mass production of millimeter-wave antennas and other devices, e.g., holograms and frequency selective absorbers, on flexible substrates. We concentrate especially on roll-to-roll reverse offset printing. The driving factors are low cost, high accuracy, high efficiency, and reliable performance. Therefore, we need to find and...
This paper presents the results from evaluation of suitable materials and ink properties for printing millimeter wave components. Dielectric parameters (relative permittivity and loss tangent) of various potential substrate materials are extracted from S-parameter measurements and simulations. Test samples have been printed over Polyethylene Terephthalate (PET) and Polyethylene Naphthalate (PEN) substrates...
This paper presents the characterization measurements and simulations performed with ACST InGaAs low-barrier Schottky diodes for millimeter wave mixing applications. While these low-barrier Schottky diodes have been successfully used for millimeter wave detector design, their performance when acting as mixers has not been tested yet. This paper shows the performance for this type of diodes in a fundamental...
In this paper, indications of charge trapping in THz Schottky diodes are investigated with various measurement techniques including current-voltage, capacitance and low-frequency noise measurements. GaAs diodes from various manufacturers are tested. For comparison purposes, results for two different diode samples are presented. Correlation between different measurement techniques is observed which...
This paper presents a new method for thermal characterization of THz Schottky diodes. The method is based on the transient current behavior, and it enables the extraction of thermal resistances, thermal time-constants, and peak junction temperatures of THz Schottky diodes. Many typical challenges in thermal characterization of small-area diode devices, particularly those related to self-heating and...
In this paper, a verification routine is developed for validating extremely fast pulsed I–V and transient current measurement setups. The measurements performed for the routine include pulsed I–V measurement with different pulse widths (using several voltage and current levels) as well as transient current measurement using different heating and measurement current levels. All the measurements are...
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