Search results for: Kehan Zhu
Microelectronics Reliability > 2011 > 51 > 2 > 332-336
Microelectronics Reliability > 2010 > 50 > 9-11 > 1393-1397
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 361 - 366
Microelectronics Reliability > 2011 > 51 > 2 > 332-336
Microelectronics Reliability > 2010 > 50 > 9-11 > 1393-1397
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 361 - 366