Search results for: Takahiro J. Yamaguchi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 6 > 1145 - 1149
Journal of Electronic Testing > 2013 > 29 > 6 > 879-892
IEEE Journal of Solid-State Circuits > 2012 > 47 > 11 > 2701 - 2710