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The design, manufacture, and test of a two-dimensional pixelated dual-threshold (DT) X-ray photon counting (XPC) detector is described. The DT-XPC detector consists of a 48 × 48-element silicon detector array hybridized to a custom readout integrated circuit (ROIC) using flip-chip bumping and bonding hybridization. The 520-micrometer-thick deep-depleted silicon detector elements are optimized for...
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