Search results for: F Schanovsky
2016 IEEE International Electron Devices Meeting (IEDM) > 30.7.1 - 30.7.4
2014 IEEE International Electron Devices Meeting > 21.1.1 - 21.1.4
2013 IEEE International Electron Devices Meeting > 15.5.1 - 15.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.2.1 - 2D.2.7
Journal of Computational Electronics > 2012 > 11 > 3 > 218-224
2010 International Electron Devices Meeting > 4.4.1 - 4.4.4
Journal of Computational Electronics > 2010 > 9 > 3-4 > 135-140