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In flip-chip package, the mismatch of thermal expansion coefficients between the silicon die, copper heat spreader and packaging substrate induces concentrated stress field around the edges and corners of silicon die during assembly, testing and services. The concentrated stresses result in delamination on various interfaces involving a range of length scales from hundreds of nanometers to millimeters...
Lid or heat spreader in flip chip packages has become a vital component for high performance and high power IC applications. While mechanics and reliability of flip chip packages have been extensively investigated in the last decade, majority of the research was focused on the packages without lid. Hence, we still lack of fundamental understanding of the impact of lid on the package reliability. In...
Underfill delamination jeopardy in flip chip organic packages is driven by shear and peeling interfacial stresses, which are directly impacted by underfill fillet geometry. Finite element analysis (FEA) models were used to analyze the effect of underfill height and width on interfacial stresses in a typical organic flip chip package configuration. Peeling and shearing stresses were computed for a...
Chip-package-interaction (CPI) induced BEoL (back-end-of-line) delamination has emerged as a major reliability concern with the adoption of Cu/low-k as the mainstream BEoL technology. To study the dependence of Cu/low-k delamination on package underfill material properties and BEoL stack up configuration, a multi-level finite element analysis modeling technique was developed to perform fracture mechanics...
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