Search results for: Po-Ying Chen
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
Microelectronics Reliability > 2013 > 53 > 2 > 265-269
Bulletin of Engineering Geology and the Environment > 2013 > 72 > 3-4 > 533-545
Mechatronics > 2011 > 21 > 1 > 239-249