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Scan shift power can be reduced by activating only a subset of scan cells in each shift cycle. In contrast to shift power reduction, the use of only a subset of scan cells to capture responses in a cycle may cause capture violations, thereby leading to fault coverage loss. In order to restore the original fault coverage, new test patterns must be generated, leading to higher test-data volume. In this...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.