Search results for: Tobias Berthold
Microelectronics Reliability > 2017 > 76-77 > C > 383-389
Applied Surface Science > 2015 > 356 > C > 921-926
Journal of Nuclear Materials > 2015 > 464 > C > 216-220
Acta Materialia > 2015 > 92 > C > 178-188
Thin Solid Films > 2015 > 584 > Complete > 310-315