Search results for: Mauro Ciappa
Microelectronics Reliability > 2017 > 76-77 > C > 460-464
Microelectronics Reliability > 2016 > 58 > C > 33-38
Microelectronics Reliability > 2016 > 58 > C > 12-16
Microelectronics Reliability > 2015 > 55 > 9-10 > 1976-1980
Microelectronics Reliability > 2015 > 55 > 9-10 > 1351-1356
Microelectronics Reliability > 2014 > 54 > 9-10 > 2123-2127
Microelectronics Reliability > 2014 > 54 > 9-10 > 2081-2087
2014 IEEE International Reliability Physics Symposium > 2C.4.1 - 2C.4.6
Microelectronics Reliability > 2013 > 53 > 9-11 > 1381-1386
Microelectronics Reliability > 2013 > 53 > 9-11 > 1403-1408
Microelectronics Reliability > 2013 > 53 > 9-11 > 1730-1734
Radiation Physics and Chemistry > 2013 > 84 > Complete > 119-125
Microelectronics Reliability > 2012 > 52 > 9-10 > 2139-2143
Microelectronics Reliability > 2012 > 52 > 9-10 > 2224-2227
Microelectronics Reliability > 2011 > 51 > 9-11 > 1673-1678
Journal of Electronic Testing > 2011 > 27 > 1 > 19-30