Search results for: F.X. Che
Microelectronics Reliability > 2015 > 55 > 12(PB) > 2769-2776
Journal of Alloys and Compounds > 2012 > 541 > Complete > 6-13
Microelectronics Reliability > 2012 > 52 > 9-10 > 1870-1875
Journal of Electronic Materials > 2012 > 41 > 9 > 2533-2542
Journal of Alloys and Compounds > 2010 > 507 > 1 > 215-224
Microelectronics Reliability > 2009 > 49 > 7 > 754-760
IEEE Transactions on Advanced Packaging > 2008 > 31 > 1 > 66 - 75