Search results for: Yi Ying
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 356 - 360
IEEE Electron Device Letters > 2007 > 28 > 9 > 828 - 830
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 356 - 360
IEEE Electron Device Letters > 2007 > 28 > 9 > 828 - 830