Search results for: Chao Ko
Microelectronics Reliability > 2017 > 72 > C > 34-38
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 936 - 942
Ceramics International > 2002 > 28 > 7 > 811-817
Ceramics International > 2002 > 28 > 7 > 805-810
Ceramics International > 2001 > 27 > 5 > 501-507
International Journal of Pressure Vessels and Piping > 2000 > 77 > 11 > 643-650