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A method of a global parametric faults diagnosis in analogue integrated circuits is presented in this paper. The method is based on basic features calculated from a circuit's under test time domain response to a voltage step, i.e. locations of maxima and minima of circuit under test response and its first order derivative. The testing and diagnosis process is executed with the use of an artificial...
This paper presents an analysis of an influence of global parametric faults (GPF) on analogue integrated circuits (AIC) time domain (TD) response features, such as overshoot, delay time, rise time, maxima and minima, first differential maxima and minima. The novel approach is the analysis of relations and superrelations between features which are discussed in details. The presented results should...
This paper presents method of deriving optimal excitation signal maximizing probability of successful fault diagnosis. The approach uses evolutionary algorithm and wavelet analysis. The diagnosis procedure is conducted by means of specialized aperiodic excitation. Results are compared with fault diagnosis using unit step excitation. The method belongs to simulation before test (SBT) class of fault...
This paper presents a new concept to analog fault diagnosis. Problem of distinguishing between healthy or faulty analog circuit has always been very complicated. The most common approach based on pattern recognition, especially on mean square error measure, can not distinguish all faulty circuits from the healthy one. Normally, the dictionary has to include thousands of patterns and even then, the...
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