Search results for: Y. Yu
IEEE Electron Device Letters > 2012 > 33 > 3 > 339 - 341
2011 International Reliability Physics Symposium > GD.1.1 - GD.1.6
IEEE Electron Device Letters > 2011 > 32 > 4 > 461 - 463
IEEE Electron Device Letters > 2011 > 32 > 3 > 396 - 398
IEEE Electron Device Letters > 2011 > 32 > 4 > 566 - 568
IEEE Electron Device Letters > 2011 > 32 > 9 > 1173 - 1175
IEEE Electron Device Letters > 2011 > 32 > 9 > 1290 - 1292
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398