Search results for: Y. Yu
2015 IEEE International Electron Devices Meeting (IEDM) > 9.5.1 - 9.5.4
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1329 - 1335
IEEE Electron Device Letters > 2011 > 32 > 2 > 128 - 130
2010 International Electron Devices Meeting > 23.3.1 - 23.3.4