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We report on growth-mode transitions in the growth of SrRuO 3 thin films on atomically flat Ti 4+ single-terminated SrTiO 3 (111) substrates, investigated by reflection high-energy electron diffraction and atomic force microscopy. Over the first ~9 unit cells, the dominant growth mode changes from island to layer-by-layer for the growth rate of 0.074 unit cells/s and the growth...
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