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Cadmium zinc telluride (CZT) is the material of choice for high‐energy room‐temperature X‐ray and γ‐ray detectors. However, the performance of pixelated detectors is greatly influenced by the quality of CZT. Crystal defects and impurities are one source of shallow and deep level traps for charge carriers. Fluorescence lifetime of the recombination of optically excited charges may indicate the presence...
Synchrotron white beam X-ray topography has been used to characterise bulk crystal defects of thick vapour grown CdZnTe crystals. Whole 50mm diameter wafers with thicknesses in the range of 2–3mm were sliced from boules grown by the multi-tube physical vapour transport method and analysed by diffraction topography in a transmission geometry. A variety of defects were observed including cracks, voids...
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