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BaTi1-x(In0.5Nb0.5)xO3 (x=0, 0.01, and 0.03) ceramic samples were prepared using the conventional solid-state reaction method. The dielectric properties of these samples were investigated as a function of temperature (300K≤T≤700K) and frequency (102Hz≤f≤106Hz). Great enhancement of dielectric constant in the dual doped samples was found. Defect diploles of [NbTi5+-Ti3+] and [NbTi5+-InTi3+] were suggest...
SrTi1-x(Al, Nb)xO3 (x=0, 0.005, 0.05, and 0.1) ceramic samples were prepared using the conventional solid-state reaction method. The dielectric properties of these samples were investigated in temperature range of 50–600°C and frequency range of 102–106Hz. The samples show two dielectric relaxations related to grain and grain boundary. The effects of (Al, Nb) co-doping were found to have influence...
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