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Secondary ion mass spectrometry (SIMS) employing an SF 5+ polyatomic primary ion source was used to depth profile through poly(methylmethacrylate) (PMMA), poly(lactic acid) (PLA) and polystyrene (PS) thin films at a series of temperatures from −125°C to 150°C. It was found that for PMMA, reduced temperature analysis produced depth profiles with increased secondary ion stability and reduced...
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