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Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is developed for hardware security applications. In this paper, we investigate wide range tolerance on applied voltage, temperature and aging influence for basic PUF characteristics utilizing SG-MONOS initial Vt variation. High-temperature stable PUF at the junction temperature (Tj)...
First-ever 28 nm embedded split-gate MONOS (SG-MONOS) flash macros have been developed to increase memory capacity embedded in micro controller units and to improve performance over wide junction temperature range from to 170 as demanded strongly in automotive uses. Much attention has been paid to the degradation of the reliability characteristics along with...
The computerization of automotive control has expanded the application range of micro controller units (MCUs). A high-end engine-control unit (ECU) requires high-performance Flash MCUs, which integrate high-speed CMOS logic and large high-performance embedded Flash memories (eFlash) [1,2]. There are also broad markets for motor control MCUs: used to control actuators in parts such as seats, windows,...
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