Wyniki wyszukiwania dla: F. Naumann
Microelectronics Reliability > 2016 > 64 > C > 266-269
Microsystem Technologies > 2016 > 22 > 1 > 207-214
Applied Physics A > 2016 > 122 > 2 > 1-6
IEEE Sensors Journal > 2010 > 10 > 2 > 353 - 362
Microsystem Technologies > 2010 > 16 > 5 > 745-754